Analyses of Accelerated Life Tests Data from General Limited Failure Population

Kim, Chong-Man

Journal of Korean Society for Quality Management > Volume 36(1); 2008 > Article

Journal of Korean Society for Quality Management 2008;36(1): 31-.

GLFP 모형하에서의 가속수명시험 데이터 분석

김종만

명지대학교 산업경영공학과

Analyses of Accelerated Life Tests Data from General Limited Failure Population

Chong-Man Kim

Department of Industrial and Management Engineering, Myongji University

ABSTRACT

This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated life tests when an infant-mortality failure mode as well as wear-out one exists. General limited failure population model is introduced to describe these failure modes. It is assumed that the log lifetime of each failure mode follows a location-scale distribution and a linear relation exists between the location parameter and the stress. An estimation procedure using the expectation and maximization algorithm is proposed. Specific formulas for Weibull distribution are obtained. An illustrative example and the simulation results are given.

Key Words: Accelerated Life Tests;Expectation and Maximization Algorithm;Wear-out and Infant-mortality Failures;General Limited Failure Population.;