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Journal of Korean Society for Quality Management 2005;33(4): 88-. |
| 검사 오류를 고려한 다단계 선별절차에 관한 연구 |
| 권혁무, 김영진 |
| 부경대학교 시스템경영공학과 |
| A Study on the Multistage Screening Procedure when Inspection Errors are Present |
| Hyuck-Moo Kwon, Young-Jin Kim |
| Systems Management and Engineering Department, Pukyong National University |
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| ABSTRACT |
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Multistage screening is a common practice when a component has a critical effect on the function of the assembly. A defect in a component might incur malfunction of an electronic device, resulting in a great amount of loss. Multistage screening, including duplicated screening inspections, may provide a good solution for this problem when inspection errors are present. In the company studied here, the manufacturing process of the multiple layer chip capacitor includes two-stage screening. In the first stage, screening inspection is performed repeatedly until no defects are found in the lot. In the second stage, sampling inspection is performed by a group of experts prior to shipment. In this article, we review the procedure used in the field and suggest a revised model of the multiple screening procedure and solution method for this situation. The usefulness of the proposed model is discussed through a practical example. |
| Key Words:
Multistage Screening;Inspection Error; |
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