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A Case Study of Graph Neural Network-Based Anomaly Detection and Root Cause Visualization for Quality Improvement in Semiconductor Manufacturing
Jueun Ha, Seungzoon Lee, Dooree Kim, Jeongil Choi
J Korean Soc Qual Manag. 2025;53(2):237-248.   Published online June 30, 2025
DOI: https://doi.org/10.7469/JKSQM.2025.53.2.237
                                    
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